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1mm Thick 25mm² FAST SDD®

A New Industry Standard in High-Efficiency!

Amptek has developed a 1mm thick 25mm2 FAST SDD® Detector in a TO-8 package. This next-generation detector extends your XRF and EDS detector’s performance to address higher photopeak efficiency at energies above 15 keV.

Double your efficiency

For a collimated source at normal incidence, the efficiency at 60 keV is x2 higher for the 1 mm detector and varies as expected from the attenuation curves. For real XRF geometries, the solid angle factor is important, so the ratio can vary.


Low Energy Spectral performance and resolution remain comparable to thinner detectors!

  • 123 eV FWHM resolution at 5.9 keV

  • 25 mm² active area collimated to 17 mm²

  • Count rates > 2,000,000 CPS

  • High peak-to-background ratio – 26,000/1

  • Preamplifier Output Rise Time <60 ns

  • Windows: Be (0.5 mil) 12.5 µm, or C2 (Si3N4)

  • Radiation hard

  • Detector thickness 1000 µm

  • TO-8 Package

  • Cooling ΔT>85 K

  • Multilayer Collimator

  • Ultra-fast benchtop and handheld XRF analyzers
  • Scanning/mapping of samples in an SEM as part of an EDS system
  • On-line process control
  • X-Ray Sorting Machines
  • OEM


  • Performance +

    Figure 3. Resolution vs. peaking time at different detector temperatures.


    Figure 4. Overlaid 55Fe spectra taken with the 25mm² x 1mm thick  FASTSDD®, and the standard 25mm2 Fast SDD showing no similar resolution and performance at lower energies (<10kev).

  • Specifications +

    Detector Type Silicon Drift Detector (SDD)
    Detector Size 25 mm2 - collimated to 17 mm2
    Silicon Thickness 1000 µm
    Collimator Internal Multi Layer Collimator (ML)
    Energy Resolution @ 5.9 keV (55Fe) 123 - 135 eV FWHM at 4 µs peaking time
    Peak to Background 20,000:1 (ratio of counts from 5.9 keV to 1 keV) (typical)
    Detector Window Options 0.5 mil (12.5 µm) Be or C2 (Si3N4)
    Charge Sensitive Preamplifier CMOS
    Gain Stability <20 ppm/°C (typical)
    XR-100FastSDD Case Size 3.00 x 1.75 x 1.13 in (7.6 x 4.4 x 2.9 cm)
    XR-100FastSDD Weight 4.4 ounces (125 g)
    Total Power <2 Watt
    Warranty Period 1 Year
    Typical Device Lifetime 5 to 10 years, depending on use
    Operation conditions -35°C to +80°C
    Storage and Shipping Long term storage: 10+ years in dry environment
    Typical Storage and Shipping: -40°C to +85°C, 10 to 90% humidity non condensing
    TUV Certification
    Certificate #: CU 72072412 02
    Tested to: UL 61010-1: 2004 R7 .05
    CAN/CSA-C22.2 61010-1: 2004
    Preamp Power XR100 configuration: ±8 V @ 15 mA with no more than 50 mV peak-to-peak noise
    OEM configuration (PA210/230 or X-123): ±5 V
    Detector Power -400 V @ 25 µA very stable <0.1% variation
    Cooler Power Current = 450 mA maximum, voltage = 3.5 V maximum with <100 mV peak-to-peak noise
    Note: the XR-100FASTSDD includes its own temperature controller
    Preamplifier Sensitivity 3.6 mV/keV typical (may vary for different detectors)
    Preamplifier Polarity Positive signal output (1 kohm maximum load)
    Preamplifier Output Rise Time <60 ns
    Preamplifier Feedback Reset
    Temperature Monitor Sensitivity Varies with configuration
    When used with PX5, DP5, or X-123: direct reading in Kelvin through software.
  • Configurations & Options +

    The 1mm Thick FAST SDD is available with the standard Amptek options and OEM configurations.

    • XR100FASTSDD with PX5
    • X-123FASTSDD
    • OEM Configurations
    • Vacuum Applications
    The XR-100 FAST SDD with the PX5 The FAST SDD with its preamplifier is available in several OEM configurations The X-123 FAST SDD configuration includes the detector, preamplifier, digital processor and power supplies all in one box The FAST SDD is compatible with all Amptek vacuum accessories
  • Mechanicals +

    • All dimensions in inches unless otherwise specified.
    • All dimensions are “typical” unless a tolerance is listed.
    • NOTE for C2 window: A nickel washer is mounted on the front surface to provide additional protection.
  • Documentation +