1mm Thick FastSDD X-Ray Detectors for XRF

Amptek has developed a 1mm thick FAST SDD® Detector in a TO-8 package. This next-generation detector extends your XRF detector’s performance, providing up to 2X photopeak detection efficiency at energies above 15 keV.  1mm thick detectors are available in both 25mm2 and 70mm2 options.

X-123 FAST SDD X-ray spectrometer for high-count-rate X-ray analysis

Product Details

Double your efficiency

For a collimated source at normal incidence, the efficiency at 60 keV is 2X higher for the 1 mm detector and varies as expected from the attenuation curves. For real XRF geometries, the solid angle factor is important, so the ratio can vary.

FAST SDD 1 mm thick silicon drift detector spectrum performance

Features

  • Down to 123 eV FWHM resolution at 5.9 keV   
  • 25 mm² active area collimated to 17 mm² or
  • 70 mm² active area collimated to 45 mm²
  • Count rates > 2,000,000 CPS
  • High peak-to-background ratio – 20,000/1 (Be window)
  • Preamplifier Output Rise Time <60 ns
  • Windows: Be (0.5 mil) 12.5 µm, or C-series (Si3N4)
  • Detector thickness 1000 µm
  • TO-8 Package
  • Cooling ΔT>85 K
  • Multilayer Collimator

Applications

  • Ultra-fast benchtop and handheld XRF analyzers
  • On-line / At-line process control
  • X-Ray Sorting Machines
  • OEM
FAST SDD 1 mm thick silicon drift detector spectrum performance

Configurations & Options

The 1mm Thick FAST SDD is available with all the standard Amptek options and OEM configurations.

  • XR100FASTSDD with PX5
  • X-123FASTSDD
  • OEM Configurations
  • Vacuum Applications

Downloads

Brochure

FAST-SDD 1mm Thick Brochure

PDF

X-123 Brochure

PDF

XR100 Brochure

PDF

Documentation

High Sensitivity Detectors for XRF

PDF

Manual

XR100-FastSDD 1mm User Manual

PDF
Amptek X-ray product technical support

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