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FastSDD X-Ray Detectors for XRF/EDS

  • FAST SDD® Ultra High Performance Silicon Drift Detector

    The FAST SDD® represents Amptek’s highest performance silicon drift detector (SDD), capable of count rates over 1,000,000 CPS (counts per second) while maintaining excellent resolution. The FAST SDD® is also available with our Patented C-Series (Si3N4) low energy windows for soft x-ray analysis.

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  • Patented C-Series Low Energy X-Ray Windows

    Amptek Patented “C-Series” X-ray windows utilize silicon nitride (Si3N4) with an aluminum coating to extend the low energy response of our silicon drift detectors (SDDs) down to boron (B); they are available exclusively with our FastSDD®.

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  • EDS (SEM) Applications FAST SDD® and C2 Window

    Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be).

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