Skip to content
USA - English
Search

Hybrid Resource Guide

Get the best performance with solid state detectors, proportional counters, photodiodes, PM tubes, CEMs, or MCPs by using Amptek Charge Sensitive Preamplifiers

Features

  • Low noise
  • Low power
  • Small size
  • High reliability

Applications

  • Aerospace
  • Portable instruments
  • Nuclear plant monitoring
  • Imaging
  • Oil logging
  • Research experiments
  • Medical and nuclear electronics
  • Electro optics

Amptek Hybrid Electronics

  • Selection Guide +


    Hybrid Selection Table (Specifications Subject to Change Without Notice)

    Model Description Characteristics Applications
    A101 Charge Sensitive Preamplifier & Discriminator Sensitivity: 1×106 electrons; Variable threshold; TTL and open collector output; 4MHz periodic; Externally adjustable discrimination levels and pulse width Pulse counting mode with: Photomultiplier tubes (PMT), Channel Electron Multipliers (CEM)
    A111 A111F Charge Sensitive Preamplifier & Discriminator Sensitivity: 5×104 electrons; Variable threshold; TTL output; 2.5MHz periodic; Analog monitor output; Externally adjustable discrimination level Pulse counting mode with: Low gain photomultiplier tubes, Proportional counters, and Microchannel plates (MCP)
    A121 12MHz Preamplifier Discriminator Sensitivity: 5×104 electrons; Voltage controlled threshold; 12MHz periodic; Analog monitor output; Adjustable pulse width Fast pulse counting mode with: Microchannel plates, Channel Electron Multipliers, Low gain PMTs, Proportional counters, and Solid state detectors
    A203 Charge Sensitive Preamplifier & Shaper Preamplifier: Noise 900 electrons RMS; Rise time 50ns Shaper: 300ns Peaking time; Sensitivity 5V/picocoulomb; Unipolar and bipolar outputs available Analog Mode with: Solid state detectors, Proportional counters, Photomultiplier tubes, and Channel Electron Multipliers
    A206 Pulse Amplifier & Discriminator Amplifier: 10x gain Discriminator: Sensitivity 50mV; 200kHz periodic; Externally adjustable low level discrimination levels and pulse width To follow a pulse shaper (A203, A225) for 10x gain and provide low level discrimination
    A225 A225F Charge Sensitive Preamplifier & Shaper Preamplifier: Noise <280 electrons RMS; Rise time 20ns Shaper: 2.5µs peaking time; Sensitivity 5V/picocoulomb Analog mode with: Solid state detector and Proportional counters Will accept high capacitance detectors
    A250 A250F  A250F/NF Charge Sensitive Preamplifier “State-Of-The-Art” External FET to match detector characteristics, allows cooling of input FET; Rise time <2.5ns; Noise <100 electrons RMS at +20 °C, <20 electrons RMS with cooled FET All possible detectors can be connected to the A250 since the input FET is external and sensitivity is variable. The A250 has been called “the best preamplifier in the world”, because it can be adjusted by the user to perfectly match the detector characteristics, reduce noise, and maximize performance in every application.
    A275 A275FC  A275FN Pulse Amplifier Low noise (4nV/√Hz); Ultra low power (15mW), High slew rate (100V/µs), Wide band (ft=200MHz); Differential input, configurable as a shaping amplifier with adjustable gain and time constants Used for gain and shaping with the A250 or other charge preamps
    A150 Pulse Amplitude Discriminator Tunnel diode snap action discriminator; Complementary CMOS outputs; 5MHz periodic; Externally adjustable discrimination level and pulse width To follow a pulse shaper (A203, A225, A275) for accurate level discrimination
    BLR1 Baseline Restorer Restores baseline in high counting rate applications For use with the A275, A203, A225
    PH300 Peak-Hold Detector To hold the peak of the analog pulse and interface with Analog to Digital converters. Both Wilkinson type and successive approximation ADC can be accommodated; Low power (<30mW); Low droop rate (<1µV/µs); Fast analog rise time (200ns) To be used with the A275, A225, A203 or any other pulse amplifier
    HV801 High Voltage Optocoupler Provides linear control of voltages up to 8 kV High voltage power supply applications

    * Test boards are offered for most hybrids in order to simplify testing and prototype work. They provide ground plane configurations and all the necessary components needed to quickly evaluate and test the product. Test boards are strongly recommended for first time users.

  • Quick Reference +


    Quick Reference

    Model Preamplifier Pulse Amplifier Discriminator Package Test Board
    A101 Yes (no output) Yes (no output) Yes (main output) TO-8(.600) – 12 Pin PC-11
    A111 Yes (no output) Yes (analog monitor) Yes (main output) TO-8(.600) – 12 Pin PC-21
    A111F Yes (no output) Yes (analog monitor) Yes (main output) SIP – 6 Pin PC-21
    A121 Yes (no output) Yes (analog monitor) Yes (voltage controlled) SIP – 9 Pin PC-121
    A203 Yes (separate input, output) Yes (separate input, output) No DIP(.300) – 16 Pin PC-236
    A206 No Yes (separate input, output) Yes (separate input, output) DIP(.300) – 16 Pin PC-236 or PC-25
    A225 Yes (timing pulse output) Yes (main output) No DIP(.300) – 14 Pin PC-25
    A225F Yes (timing pulse output) Yes (main output) No SIP – 6 Pin None
    A250 Yes (external FET, variable gain) No No DIP(.300) – 14 Pin PC-250
    A250F Yes (internal FET, variable gain) No No SIP – 6 Pin PC-250F/NF
    A250F/NF Yes (external FET, variable gain) No No SIP – 6 Pin PC-250F/NF
    A275 No Yes (externally adjustable gain and shaping time) No DIP(.300) – 14 Pin PC-275
    A275FC No Yes (externally adjustable gain and shaping time) No SIP – 6 Pin None
    A275FN No Yes (externally adjustable gain and shaping time) No SIP – 6 Pin None
    A150 No No Yes (voltage controlled) DIP(.300) – 14 Pin None
    BLR1 No No No TO-8(.500) – 12 Pin PC-275

    * Test boards are offered for most hybrids in order to simplify testing and prototype work. They provide ground plane configurations and all the necessary components needed to quickly evaluate and test the product. Test boards are strongly recommended for first time users.

  • Screening Options +


    Screening Options for Hybrids

    Standard: “Amptek High Reliability Screening”

     

    • Nondestructive Bond Pull (100%), MIL-STD-883 Rev K, Method 2023
    • Precap Visual: MIL-STD-883, Method 2017, Condition H, low magnification, high magnification
    • Electrical Test: As per Specifications
    • Sealing: Welded, Hermetic Seal
    • Marking: Date Code and Serial Number
    • Stabilization Bake: MIL-STD-883, Method 1008, Condition C. +150 °C, 24 hours minimum
    • Temperature Cycle: MIL-STD-883, Method 1010, Condition C. Min. T=-65 °C to +150 °C, 10 minutes each extreme, 5 minutes maximum transfer time, 10 cycles
    • Centrifuge: MIL-STD-883, Method 2001, condition A. YI axis; 5,000 G’s
    • Burn-In Test: MIL-STD-883, Method 1015, 160 hours at +125 °C
    • Fine Leak Test: MIL-STD-883, Method 1014, Condition A. Rejection if leak rate in excess of 5×10-7 cc/sec.
    • Gross Leak Test: MIL-STD-883, Method 1014, Condition C. Perfluorocarbon
    • Electrical Test: As per Specification
    • External Visual: MIL-STD-883, Method 2009
    Option 1: Includes STANDARD Screening plus the following:

     

    • Particle Impact Noise Detection (PIND), MIL-STD-883, Method 2020
    • Radiographic, MIL-STD-883, Method 2012
    • Final Electrical Tests at +70 °C and -25 °C
    Option 1 + Screening: Includes STANDARD Screening plus Option 1 plus the following:

     

    • SEM on all active components, MIL-STD-883, Method 2018
    • Package evaluation, MIL-STD-883, Sub-Groups 1-4 and 6
    • Substrate Evaluation, MIL-PRF-38534 (Appendix C)
    • Customer Pre-cap Visual Inspection (Optional)
    • Extended Burn-In: MIL-STD-883, Method 1015, Total of 240 hours at +125 °C
    • Lot Qualification: RGA, MIL-STD-883, Method 1018 on 1 to 3 pieces
    • Lot Qualification: 1,000 hours Steady State Life Test at 125 °C on 4 to 10 pieces
    Option 2: NASA Goddard Space Flight Center Preferred Parts List (PPL-20), GSFC S-311-P698 includes STANDARD Screening, plus OPTION 1, plus the following:

     

    • Pre-assembly Parts Qualification (Element Evaluation)
    • Package Evaluation
    • Customer Pre-cap Visual Inspection
    • Destructive Bond Pull Test on sample devices
    • Die Shear Test on sample devices
    • Moisture Test
    • Optional Extended Burn-In
    • Pre and Post Burn-In Deltas
    • Additional Quality Control Inspections (QCI)
    • Lot Qualification: 1,000 hours Steady State Life Test at 125 °C on sample lot (4 to 10 pieces)
    NOTES: 1) Option 1: 100 piece minimum order for each hybrid type 2) Option 1+ Screening, Option 2: not always available, please contact Amptek sales office. 3) Price and delivery upon request.

  • Space Missions +


    Space missions in which Amptek’s products have been included or selected for flight

  • Documentation +