SUPER FAST Silicon Drift Detector (SDD)

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Figure 1. The FAST SDD™ in the XR100 and PX5.	FAST SDD™ 125 eV Resolution! Count Rate > 1,000,000 CPS	Figure 2. The FAST SDD™ in the X-123SDD configuration, which includes the detecor, preamplifier, digital processor, and power supplies all in one box.
The FAST SDD™ is a new high performance silicon drift detector, preamplifier, and cooler system. Also mounted on the 2-stage cooler is the preamplifier and feedback circuit. These components are kept at approximately -55 °C, and are monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight thin Beryllium window to enable soft x-ray detection.
Features 125 eV FWHM Resolution @ 5.9 keV Hight Count Rate - > 1,000,000 CPS High Peak-to-Background Ratio - 20,000:1 Available with C Series Low Energy Windows	Applications On-Line Process Control SEM Scanning Applications FAST Hand-held and Bench-top XRF Analyzers
Figure 3. FAST SDD™ Element.	Figure 4. The detector/preamplifier is available in OEM configurations. See the OEM page for details.

Performance Characteristics

Fast SDD resolution vs. peaking time
Figure 5. Resolution vs. Peaking Time for the Fast SDD compared to the standard SDD.

Fast SDD throughput
Figure 6. Throughput for the Fast SDD.

Fast SDD resolution vs. input count rate
Figure 7. Resolution vs. Input Counts Rate (ICR) for Various Peaking Times for Fast SDD.

Fast SDD 1 second ss316 spectrum
Figure 8. Stainless Steel 316 Spectrum taken in 1 second with the Fast SDD.

The below table displays the quantitative analysis of the data in figure 8. This spectrum was taken in 1 second with the Fast SDD.

Mn spectrum at 1.2 Mcps with the Fast SDD
Figure 9. Mn spectrum taken at 1.2 Mcps (0.2 µs peaking time) with the Fast SDD.

Solder spectrum in 1 second with the Fast SDD
Figure 10. Solder spectrum taken in 1 second (1 µs peaking time) with the Fast SDD.

Revised May 3, 2013