Figure 1. The FAST SDD™ in the XR100 and PX5.
125 eV Resolution!
Count Rate > 1,000,000 CPS
The FAST SDD™ is a new high performance silicon drift detector, preamplifier, and cooler system. Also mounted on the 2-stage cooler is the preamplifier and feedback circuit. These components are kept at approximately -55 °C, and are monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight thin Beryllium window to enable soft x-ray detection.
|125 eV FWHM||8 µs|
|135 eV FWHM||1 µs|
|155 eV FWHM||0.2 µs|
Figure 5. Resolution vs. Peaking Time for the Fast SDD compared to the standard SDD.
Figure 6. Throughput for the Fast SDD.
Figure 7. Resolution vs. Input Counts Rate (ICR) for Various Peaking Times for Fast SDD.
Figure 8. Stainless Steel 316 Spectrum taken in 1 second with the Fast SDD.
The below table displays the quantitative analysis of the data in figure 8. This spectrum was taken in 1 second with the Fast SDD.
Result in 1 second
|V||0.05||0.16 ± 0.28|
|Cr||18.45||18.32 ± 0.80|
|Mn||1.63||0.40 ± 0.55|
|Fe||64.51||65.89 ± 1.64|
|Co||0.10||0.00 ± 0.40|
|Ni||12.18||12.56 ± 0.47|
|Cu||0.17||0.19 ± 0.02|
|Mo||2.38||2.34 ± 0.08|
Figure 9. Mn spectrum taken at 1.2 Mcps (0.2 µs peaking time) with the Fast SDD.
Figure 10. Solder spectrum taken in 1 second (1 µs peaking time) with the Fast SDD.
Fast SDD Announcement (PDF)
Revised May 3, 2013